Yazar "Coşkun, Emre" için listeleme
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3D Profile Measurements of Objects by Using Zero Order Generalized Morse Wavelet
Koçahan, Özlem; Durmuş, Çagla; Elmas, Merve Naz; Coşkun, Emre; Tiryaki, Erhan; Özder, Serhat (Amer Inst Physics, 2017)Generalized Morse wavelets are proposed to evaluate the phase information from projected fringe pattern with the spatial carrier frequency in the x direction. The height profile of the object is determined through the phase ... -
Determination of phase from the ridge of CWT using generalized Morse wavelet
Koçahan, Özlem; Tiryaki, Erhan; Coşkun, Emre; Özder, Serhat (Iop Publishing Ltd, 2018)The selection of wavelet is an important step in order to determine the phase from the fringe patterns. In the present work, a new wavelet for phase retrieval from the ridge of continuous wavelet transform (CWT) is presented. ... -
Generalized Morse wavelet for the determination of the birefringence of a liquid crystal cell
Koçahan, Özlem; Coşkun, Emre; Özder, Serhat (Iop Publishing Ltd, 2015)The generalized Morse wavelet (GMW) was improved as an alternative tool to determine the birefringence dispersion of a liquid crystal (LC) material by using the transmittance spectrum. The GMW has two degrees of freedom ... -
The generalized Morse wavelet method to determine refractive index dispersion of dielectric films
Koçahan, Özlem; Özcan, Seçkin; Coşkun, Emre; Özder, Serhat (Iop Publishing Ltd, 2017)The continuous wavelet transform (CWT) method is a useful tool for the determination of refractive index dispersion of dielectric films. Mother wavelet selection is an important factor for the accuracy of the results when ... -
Generalized Morse wavelets for the phase evaluation of projected fringe pattern
Koçahan, Özlem; Coşkun, Emre; Özder, Serhat (Iop Publishing Ltd, 2014)Generalized Morse wavelets are proposed to evaluate the phase information from projected fringe pattern with the spatial carrier frequency in the x direction. The height profile of the object is determined through the phase ... -
An Improved Method For Determination of Refractive Index of Absorbing Films: A Simulation Study
Özcan, Seçkin; Coşkun, Emre; Koçahan, Özlem; Özder, Serhat (Amer Inst Physics, 2017)In this work an improved version of the method presented by Gandhi was presented for determination of refractive index of absorbing films. In this method local maxima of consecutive interference order in transmittance ... -
An Improved Method For the Determination of Birefringence Dispersion of Liquid Crystal Cell: A Simulation Study
Özcan, Seçkin; Coşkun, Emre; Koçahan, Özlem; Özder, Serhat (Amer Inst Physics, 2016)An improved approach to determine the birefringence dispersion of a liquid crystal cell was presented. Using the local maxima or minima of the transmittance spectrum of liquid crystal cell is a very convenient method for ... -
Optical Phase Distribution Evaluation by Using Zero Order Generalized Morse Wavelet
Koçahan, Özlem; Elmas, Merve Naz; Durmuş, Çagla; Coşkun, Emre; Tiryaki, Erhan; Özder, Serhat (Amer Inst Physics, 2017)When determining the phase from the projected fringes by using continuous wavelet transform (CWT), selection of wavelet is an important step. A new wavelet for phase retrieval from the fringe pattern with the spatial carrier ... -
Quantitative Phase Imaging of Red Blood Cell by Diffraction Phase Microscopy
Koçahan, Özlem; Tiryaki, Erhan; Durmuş, Çagla; Elmas, Merve Naz; Coşkun, Emre; Özder, Serhat (IEEE, 2017)Diffraction phase microscopy maintains the single shot measurement and low speckle noise associated with white light. A microscope with halogen lamp and a Mach-Zehnder interferometer were combined to obtain images of red ... -
A Simulation Study for Determination of Refractive Index Dispersion of Dielectric Film from Reflectance Spectrum by Using Paul Wavelet
Tiryaki, Erhan; Coşkun, Emre; Koçahan, Özlem; Özder, Serhat (Amer Inst Physics, 2017)In this work, the Continuous Wavelet Transform (CWT) with Paul wavelet was improved as a tool for determination of refractive index dispersion of dielectric film by using the reflectance spectrum of the film The reflectance ... -
Simultaneous determination of the thickness and refractive index dispersion of dielectric films by the Paul wavelet transform
Özcan, Seçkin; Coşkun, Emre; Koçahan, Özlem; Özder, Serhat (Elsevier B.V., 2019)The continuous wavelet transform with Paul wavelet was proposed as a method for the simultaneous determination of physical thickness and refractive index dispersion of dielectric films in the visible and near infrared ...